Integrated light scatter instruments can be characterized with respect to their ability to measure microroughness on different length scales. A methodology and computer program has been developed which allows instrument manufacturers to determine the transfer functions for their instruments. See Spatial Frequency Response Function.
Characterization of light scattering methodologies, such as determining instrument signature functions, play an important role in our work. For example, the BRDF that an instrument measures for a perfectly flat and defectless surface is dominated by the Rayleigh scatter in the air within the field of view of the instrument. This Rayleigh-equivalent polarized BRDF has been calculated and experimentally verified.
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